The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2014
Filed:
Apr. 30, 2009
Jose Melendez, Lakeway, TX (US);
James Watson, Plano, TX (US);
John Michael Dimaio, Dallas, TX (US);
Roma Moza, Plano, TX (US);
Jose Melendez, Lakeway, TX (US);
James Watson, Plano, TX (US);
John Michael DiMaio, Dallas, TX (US);
Roma Moza, Plano, TX (US);
Board of Regents, The University of Texas System, Austin, TX (US);
Abstract
The present invention is a multi-wavelength diagnostic imager. In one embodiment, the present invention includes an apparatus and method for noninvasive evaluation of a target versus a non-target, comprising: one or more light sources having at least one emission spectra directed at the target wherein the position, orientation and intensity of light sources is varied to control near-surface reflectance and are directed at less than the entire target; and one or more detectors positioned to capture light reflected from the target into two or more spatial images of the target at two or more times, wherein the spatial images are used to distinguish between the target and the non-target.