The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2014
Filed:
Apr. 22, 2008
Shanchuan Su, Neubiberg, DE;
Jürgen Schützmann, Pfaffenhofen, DE;
Helmut Steidl, München, DE;
Dieter Stein, Holzkirchen, DE;
Shanchuan Su, Neubiberg, DE;
Jürgen Schützmann, Pfaffenhofen, DE;
Helmut Steidl, München, DE;
Dieter Stein, Holzkirchen, DE;
Giesecke & Devrient GmbH, Munich, DE;
Abstract
The invention relates to a method and apparatus for recognizing forged value documents, for example composed forgeries which are assembled from parts of different value documents. In the inventive method, the signal intensity of a measuring signal is determined at a plurality of measuring points on a value document. For one or more selected groups of measuring points which are disposed in particular along certain directions on the value document there are determined gradient values of the signal intensities. The gradient values of a group are subsequently linked to form a connection strength of the group which provides a quantitative statement about the extent to which a large gradient value exists consistently within the particular group. From a relatively great connection strength there can be inferred the presence of a separating line in the area of the selected group of measuring points.