The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2014
Filed:
Sep. 13, 2010
Kwang Eun Jang, Yongin-si, KR;
Young Hun Sung, Yongin-si, KR;
Jong Ha Lee, Yongin-si, KR;
Sung Su Kim, Yongin-si, KR;
Seok Min Han, Yongin-si, KR;
Dong-goo Kang, Yongin-si, KR;
Kwang Eun Jang, Yongin-si, KR;
Young Hun Sung, Yongin-si, KR;
Jong Ha Lee, Yongin-si, KR;
Sung Su Kim, Yongin-si, KR;
Seok Min Han, Yongin-si, KR;
Dong-Goo Kang, Yongin-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
Disclosed are a multi-energy x-ray system, an image processing apparatus for discriminating a multi-energy x-ray material, and an image processing method for material discrimination of a multi-energy x-ray system. The image processing apparatus for discriminating a multi-energy x-ray material according to one aspect of the present invention comprises: a table for recording attenuation information and multi-energy x-ray spectrum information which correspond to one or more materials; an initial image estimating portion for estimating an initial image of each of the materials with respect to a projection image of each of the energy bands generated when a multi-energy x-ray spectrum passes through a detecting target formed with one or more materials; and an image update portion for updating the initial image as the material discrimination image using the estimated initial image and the spectrum information recorded in the table and the attenuation information recorded in the table.