The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2014

Filed:

Sep. 21, 2012
Applicant:

British Telecommunications Public Limited Company, London, GB;

Inventors:

David Michael Rohlfing, London, GB;

Mark Andrew Fletcher, London, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04M 1/24 (2006.01); H04M 3/08 (2006.01); H04M 3/22 (2006.01);
U.S. Cl.
CPC ...
H04M 3/22 (2013.01);
Abstract

A method is proposed for calculating a line performance, or stability, measure for a telephone line. Various physical parameters associated with the line, such as insulation resistance, capacitance and DC voltages, are measured. The values for each of the parameters are compared to expected values, which are based on historical values measured for that line. Individual performance measures for each parameter are calculated based on the difference between the actual and expected values, normalised by the deviation of that parameter. The deviation accounts for general fluctuations across all the lines. A weighting value is also applied, based on knowledge of values relevant to the good operation of lines. The deviation effectively gives a scaling, and the weighting gives a context to the measured values for a single line. The individual performance measures are summed to get the final performance measure for the line. Thus, the performance measure for the line gives an indication of the stability of that line, based on analysis of the past performance of that line, and taking into account the general fluctuations seen over all lines.


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