The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2014

Filed:

Nov. 01, 2012
Applicants:

Hua Zhong, San Jose, CA (US);

Dheer Moghe, Sunnyvale, CA (US);

Sazzala Venkata Reddy, Sunnyvale, CA (US);

Inventors:

Hua Zhong, San Jose, CA (US);

Dheer Moghe, Sunnyvale, CA (US);

Sazzala Venkata Reddy, Sunnyvale, CA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Data replication comprises: redistributing one or more originator data subsets among a plurality of originator nodes; determining data redistribution information pertaining to redistribution of the one or more originator data subsets among the plurality of originator nodes; and sending data redistribution information to a replica system. The data redistribution information is used by the replica system to redistribute one or more corresponding replica data subsets among a plurality of replica nodes; and the one or more corresponding replica data subsets are redistributed among the plurality of replica nodes without requiring the one or more originator data subsets to be sent to the replica system during redistribution.


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