The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2014
Filed:
Dec. 18, 2013
Wd Media, Llc, San Jose, CA (US);
Dragos I. Mircea, San Jose, CA (US);
Andreas Moser, San Jose, CA (US);
Harold H. Gee, San Jose, CA (US);
WD Media, LLC, San Jose, CA (US);
Abstract
Systems and methods for making fast measurements of channel performance metrics such as error margin and off-track recording capability in shingled magnetic recording are provided. One such method involves writing a plurality of shingled tracks on the disk, measuring an off track read capability (OTRC) of each of the plurality of shingled tracks, determining radial endpoints of the measured OTRC for each of the plurality of shingled tracks, determining an approximate radial center for each of the plurality of shingled tracks based on the respective OTRC radial endpoints, and measuring a channel performance metric at a range centered around the approximate radial center for each of the plurality of shingled tracks. In one such case, the channel performance metric involves error margin. One such system includes a processor coupled to a memory, a magnetic transducer, and a test platform, where the processor is configured to perform the method.