The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2014

Filed:

Sep. 17, 2012
Applicant:

Western Digital (Fremont), Llc, Fremont, CA (US);

Inventors:

Zhong Shi, Dublin, CA (US);

Michael V. Morelli, San Jose, CA (US);

Hongxing Yuan, San Ramon, CA (US);

Assignee:

Western Digital (Fremont), LLC, Fremont, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G11B 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods and apparatuses for characterizing near field transducer performance at wafer level using asymmetric interference waveguides are provided. One such system includes a light source, an input grating configured to receive light from the light source, a first waveguide arm and a second waveguide arm, each configured to receive the light, a surface plasmon receptor optically coupled to the first waveguide arm and the second waveguide arm and configured to receive light from the first waveguide arm in a first direction and the second waveguide arm in a second direction opposite of the first direction, where the first and the second waveguide arms are configured to induce a preselected phase difference in light arriving at the surface plasmon receptor, and an output grating optically coupled to the surface plasmon receptor, and a light detector coupled to, and configured to detect light from, the first output grating.


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