The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2014

Filed:

Sep. 27, 2012
Applicants:

Maxim Nikiforov, Chicago, IL (US);

Seth B. Darling, Chicago, IL (US);

Ozgun Suzer, Chicago, IL (US);

Jeffrey Guest, Northbrook, IL (US);

Andreas Roelofs, Wheaton, IL (US);

Inventors:

Maxim Nikiforov, Chicago, IL (US);

Seth B. Darling, Chicago, IL (US);

Ozgun Suzer, Chicago, IL (US);

Jeffrey Guest, Northbrook, IL (US);

Andreas Roelofs, Wheaton, IL (US);

Assignee:

Uchicago Argonne, LLC, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/01 (2006.01); G01N 21/55 (2014.01); G01N 21/59 (2006.01);
U.S. Cl.
CPC ...
G01N 21/01 (2013.01); G01N 21/59 (2013.01); G01N 21/55 (2013.01);
Abstract

Systems and methods for opto electric properties are provided. A light source illuminates a sample. A reference detector senses light from the light source. A sample detector receives light from the sample. A positioning fixture allows for relative positioning of the sample or the light source with respect to each other. An electrical signal device measures the electrical properties of the sample. The reference detector, sample detector and electrical signal device provide information that may be processed to determine opto-electric properties of the same.


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