The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2014
Filed:
May. 04, 2012
Garth J. Simpson, West Lafayette, IN (US);
Duangporn Wanapun, New London, CT (US);
Lynne S. Taylor, West Lafayette, IN (US);
Umesh S. Kestur, North Brunswick, NJ (US);
Scott J. Toth, West Lafayette, IN (US);
Garth J. Simpson, West Lafayette, IN (US);
Duangporn Wanapun, New London, CT (US);
Lynne S. Taylor, West Lafayette, IN (US);
Umesh S. Kestur, North Brunswick, NJ (US);
Scott J. Toth, West Lafayette, IN (US);
Purdue Research Foundation, West Lafayette, IN (US);
Abstract
An apparatus and method for performing volume scanning of a sample comprised of chiral materials disposed in a matrix of non-chiral materials is disclosed. A laser is raster scanned in a plane of the volume such that the intensity of energy in the focal region is sufficient to generate second harmonic (SHG) energy. This energy is detected and may be processed into three dimensional images of the volume. The raster pattern is repeatedly stepped over an area of the sample so as to produce three dimensional images of time-dependent processes.