The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2014

Filed:

Dec. 19, 2011
Applicants:

Mari Ohbuchi, Yokohama, JP;

Keisuke Kawamoto, Hitachinaka, JP;

Hirotomo Sai, Yokohama, JP;

Shinichi Nonaka, Zushi, JP;

Inventors:

Mari Ohbuchi, Yokohama, JP;

Keisuke Kawamoto, Hitachinaka, JP;

Hirotomo Sai, Yokohama, JP;

Shinichi Nonaka, Zushi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/64 (2006.01); H04N 5/367 (2011.01);
U.S. Cl.
CPC ...
H04N 5/367 (2013.01);
Abstract

An image signal processing apparatus includes an imaging unit having an imaging element to conduct photoelectric conversion on incident light from a subject and output an electric signal, a defective pixel detection unit for detecting a defective pixel in the imaging element, a defective pixel correction unit for correcting the detected defective pixel, an image signal correction unit for conducting image signal correction every arbitrary area on a signal supplied from the defective pixel correction unit, a system control unit for generally controlling those units, and a temperature measurement unit for measuring temperature in the vicinity of the imaging element. The system control unit controls a detection condition to be used when the defective pixel detection unit detects a defective pixel, i.e., one or more of an exposure time, a defective pixel detection threshold, and a gain, by using information of the temperature obtained from the temperature measurement unit.


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