The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2014

Filed:

Jun. 20, 2011
Applicants:

Tsu-chin Tsao, Manhattan Beach, CA (US);

Jason T. Wilson, Los Angeles, CA (US);

Inventors:

Tsu-Chin Tsao, Manhattan Beach, CA (US);

Jason T. Wilson, Los Angeles, CA (US);

Assignee:

Vantage Surgical Systems, Inc., Los Angeles, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); G03B 21/26 (2006.01); A61B 19/00 (2006.01); G02B 26/00 (2006.01);
U.S. Cl.
CPC ...
A61B 19/5225 (2013.01); A61B 19/00 (2013.01); A61B 2019/5291 (2013.01); G02B 26/00 (2013.01);
Abstract

The present disclosure provides augmented reality methods and systems where two or more component optical images are optically overlaid via one or more beam splitters to form composite optical images. In some embodiments a second component optical image is an electronic optical image (an image from an electronically controlled emission source) while the first component optical image is one of a physical optical image (an image of a physical object from which diffuse reflection occurs), an electronic optical image, an emission optical image (an image from a non-electronic source that emits radiation), or a hybrid optical image (composed of at least two of a physical optical image, and electronic optical image, or an emission optical image). In some embodiments the first and second component optical images are used to provide feedback concerning the quality of the overlaying and appropriate correction factors to improve the overlay quality.


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