The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2014
Filed:
Oct. 08, 2009
Applicants:
Kenji Oyama, Tokyo, JP;
Takuya Tsujimoto, Kawasaki, JP;
Inventors:
Kenji Oyama, Tokyo, JP;
Takuya Tsujimoto, Kawasaki, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/00 (2006.01); G02B 27/14 (2006.01); G02B 27/01 (2006.01); G02B 27/00 (2006.01);
U.S. Cl.
CPC ...
G02B 27/0068 (2013.01); G02B 27/01 (2013.01); G02B 2027/014 (2013.01); G02B 27/0101 (2013.01); G02B 2027/011 (2013.01);
Abstract
Units which respectively acquire information on an aberration generated by a display optical system and information on an aberration generated by a vision correction optical system used by an observer are arranged. Aberration correction is executed based on the two aberrations. An aberration generated by a combination of the display optical system and the vision correction optical system used by the observer can be appropriately corrected for each observer.