The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2014
Filed:
Aug. 24, 2011
Applicants:
Tamami Maruyama, Yokohama, JP;
Tomoyuki Ohya, Yokohama, JP;
Tatsuo Furuno, Yokosuka, JP;
Kunio Sawaya, Miyagi, JP;
Qiang Chen, Miyagi, JP;
Jianfeng LI, Miyagi, JP;
Shiwei Qu, Miyagi, JP;
Qiaowei Yuan, Miyagi, JP;
Inventors:
Tamami Maruyama, Yokohama, JP;
Tomoyuki Ohya, Yokohama, JP;
Tatsuo Furuno, Yokosuka, JP;
Kunio Sawaya, Miyagi, JP;
Qiang Chen, Miyagi, JP;
Jianfeng Li, Miyagi, JP;
Shiwei Qu, Miyagi, JP;
Qiaowei Yuan, Miyagi, JP;
Assignees:
NTT DoCoMo, Inc., Tokyo, JP;
Tohoku University, Sendai-shi, JP;
Primary Examiner:
Int. Cl.
CPC ...
H01Q 1/38 (2006.01); H01Q 15/00 (2006.01);
U.S. Cl.
CPC ...
H01Q 15/002 (2013.01); H01Q 1/38 (2013.01);
Abstract
A reflectarray, including: a substrate; and a plurality of patches formed on each of areas into which a principal surface of the substrate is divided, wherein the plurality of patches are formed by including a gap.