The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2014

Filed:

Jul. 29, 2011
Applicants:

Manish Marwah, Palo Alto, CA (US);

Chandrakant Patel, Fremont, CA (US);

Geoff M. Lyon, Half Moon Bay, CA (US);

Martha L. Lyons, Sunnyvale, CA (US);

Martin Arlitt, Calgary, CA;

Cullen E. Bash, Los Gatos, CA (US);

Inventors:

Manish Marwah, Palo Alto, CA (US);

Chandrakant Patel, Fremont, CA (US);

Geoff M. Lyon, Half Moon Bay, CA (US);

Martha L. Lyons, Sunnyvale, CA (US);

Martin Arlitt, Calgary, CA;

Cullen E. Bash, Los Gatos, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 21/00 (2006.01); H04Q 9/00 (2006.01);
U.S. Cl.
CPC ...
H04Q 9/00 (2013.01); H04Q 2209/845 (2013.01);
Abstract

In an embodiment, a device characterization system includes a sensor to sense an attribute of a device, a processor, and an algorithm executable on the processor to collect time series data of the attribute from the sensor, detect edges in the data, identify clusters from the edges, label the clusters based on input from a supervisor, and estimate device characterization parameters from the clusters.


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