The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2014
Filed:
Apr. 14, 2008
Thomas A. Dean, Maple Valley, WA (US);
Paul H. Shelley, Lakewood, WA (US);
Thomas A. Dean, Maple Valley, WA (US);
Paul H. Shelley, Lakewood, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A method of non-destructively determining the condition of a material, said method including providing an elongated probe containing a plurality of optical fibers, said elongated probe coupled to an infrared spectrometer, said tip of said elongated probe positioned near said material, said elongated probe including said tip having a width of less than about 2.0 mm; and, making an infrared spectroscopy measurement of said material by providing infrared light from said infrared spectrometer through at least one of said plurality of optical fibers and collecting at least a portion of said infrared light reflected from a material juxtaposed near said tip through at least another of said plurality of optical fibers to provide said reflected light to said infrared spectrometer.