The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8835261 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 16, 2014

Filed:

Mar. 14, 2011
Applicants:

Edward J. Nowak, Essex Junction, VT (US);

Richard Q. Williams, Essex Junction, VT (US);

Inventors:

Edward J. Nowak, Essex Junction, VT (US);

Richard Q. Williams, Essex Junction, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 21/31 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66818 (2013.01); H01L 29/66795 (2013.01); H01L 29/785 (2013.01);
Abstract

The disclosure relates generally to a metal-oxide-semiconductor field effect transistor (MOSFET) structures and methods of forming the same. The MOSFET structure includes at least one semiconductor body on a substrate; a dielectric cap on a top surface of the at least one semiconductor body, wherein a width of the at least one semiconductor body is less than a width of the dielectric cap; a gate dielectric layer conformally coating the at least one semiconductor body; and at least one electrically conductive gate on the gate dielectric layer.


Find Patent Forward Citations

Nowak, Edward. (2014). Field effect transistor structure and method of forming same (U.S. Patent No. 8835261). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8835261

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…