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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8835204 B1

PDFFull Text
Date of Patent:
Sep. 16, 2014

Filed:

Dec. 30, 2011

Method for manufacturing multi-dimensional target waveguide grating and volume grating with micro-structure quasi-phase-matching

Applicants:

Yuechun Shi, Nanjing, CN;

Xiangfei Chen, Nanjing, CN;

Inventors:

Yuechun Shi, Nanjing, CN;

Xiangfei Chen, Nanjing, CN;

Assignee:

Nanjing University, Nanjing, CN;

Attorney:

Treasure IP Group

Primary Examiner:

Evan Pert

Assistant Examiner:

Gustavo Ramallo

Int. Cl.
CPC ...
H01L 21/00 (2006.01); G02B 6/26 (2006.01); G02B 6/42 (2006.01); G02B 6/34 (2006.01); G02B 27/00 (2006.01); G02B 5/18 (2006.01); H01S 5/20 (2006.01); G02B 6/122 (2006.01);
U.S. Cl.
CPC ...
H01S 5/2031 (2013.01); G02B 5/1857 (2013.01); G02B 5/1823 (2013.01); G02B 6/1225 (2013.01);
Abstract

A method for manufacturing a multi-dimensional target waveguide grating and volume grating with micro-structure quasi-phase-matching. An ordinary waveguide grating is used as a seed grating, and on this basis, a two-dimensional or three-dimensional sampling structure modulated with a refractive index, that is, a sampling grating, is formed. The sampling grating comprises multiple shadow gratings, and one of the shadow gratings is selected as a target equivalent grating. A sampled grating comprises Fourier components in many orders, that is, shadow gratings, a corresponding grating wave vector is [Formula 1], and the grating profile of all the shadow gratings changes with the sampling structure [Formula 2]. In a case where a seed grating wave vector [Formula 3] and a required two-dimensional or three-dimensional grating wave vector do not match, a certain Fourier periodic structure component of the Fourier components of the sampling structure is used to compensate for the wave vector mismatch. The manufacturing method may be applied to design and manufacture a multi-dimensional target waveguide grating and volume grating for any grating profile, and may simplify the grating manufacturing process and also make possible a variety of grating-based photon devices.

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