The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2014
Filed:
Apr. 19, 2013
Shanghai Mediworks Precision Instruments Co. Ltd, Shanghai, CN;
Yue Wei, Shanghai, CN;
Wenguang Chen, Shanghai, CN;
Sufeng Yan, Shanghai, CN;
Yunxiao Han, Shanghai, CN;
Shaojuan Wang, Shanghai, CN;
Xianran Peng, Shanghai, CN;
Hang Yu, Shanghai, CN;
Zhaosong Kong, Shanghai, CN;
Shanghai Mediworks Precision Instruments Co. Ltd, Shanghai, CN;
Abstract
The present patent application discloses a digital slit-lamp microscope system and the methods of the electronic recording and remote diagnosis. The present patent application relates to the field of optical instrument and remote communication control. The purpose is to solve the problems of the electronic recording, reappearing and remote diagnosis of the slit-lamp image. The digital slit-lamp microscope system comprises digital slit-lamp microscope side, communication unit and client side. The digital slit-lamp microscope side includes a build-in slit-lamp microscope and is connected to the communication unit and the client side in sequence. The digital slit-lamp microscope side irradiates the eyes of the patient, and then transmits the pathology information of the eyes of the patient to the communication unit and the client side in sequence.