The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2014
Filed:
Aug. 24, 2012
Bing-jun Zhang, Shenzhen, CN;
Bing-Jun Zhang, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, CN;
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Abstract
A measurement apparatus includes a workbench, a loading mechanism fixed to the workbench, a deformation measuring mechanism, and a stress meter. The deformation measuring mechanism includes a slide beam, and a displacement meter. The loading mechanism includes a guiding shaft extending through a to-be-tested coil spring. A measuring pole of the stress meter, the sliding beam, and the guiding shaft are coaxial. Opposite ends of the coil spring are respectively abutted the slide beam and the loading mechanism. A measuring pole of the displacement meter is connected to the sliding beam. When the stress meter slides towards the slide beam, the displacement of the detecting pole of the displacement member is equal to a change of a length of the coil spring, and recorded by the displacement meter, and a value of a force applied to the coil spring is recorded by the stress meter.