The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Jun. 18, 2010
Mark A. Thober, Columbia, MD (US);
J. Aaron Pendergrass, Silver Spring, MD (US);
C. Durward Mcdonell, Iii, Olney, MD (US);
Michael D. Dirossi, Ellicott, MD (US);
Mark A. Thober, Columbia, MD (US);
J. Aaron Pendergrass, Silver Spring, MD (US);
C. Durward McDonell, III, Olney, MD (US);
Michael D. DiRossi, Ellicott, MD (US);
The Johns Hopkins University, Baltimore, MD (US);
Abstract
A method for achieving atomicity while inspecting a running computer process using a copy-on-write process in a supervisor to generate a copy of a target's memory page being written to, prior to executing the write, the copy along with any unwritten to memory pages in the target being mapped to a measurement agent (MA) and used to reflect the state of the target at a particular moment in time which state when observed by the MA provides an atomic runtime inspection.