The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Sep. 05, 2012
Suharli Tedja, San Ramon, CA (US);
Swarupchandra Kamerkar, Pune, IN;
Vineet Sreekumar, Mumbai, IN;
Yadvinder Singh, Jind, IN;
Suharli Tedja, San Ramon, CA (US);
Swarupchandra Kamerkar, Pune, IN;
Vineet Sreekumar, Mumbai, IN;
Yadvinder Singh, Jind, IN;
LSI Corporation, San Jose, CA (US);
Abstract
First and second apparent resistance measures are determined for an integrated circuit and utilized to characterize the integrated circuit. The first apparent resistance measure is determined for the integrated circuit based on a first voltage drop and a first current that are measured using test equipment. The second apparent resistance measure is determined for the integrated circuit based on a second voltage drop and a second current that are obtained using static analysis of a corresponding integrated circuit design. The integrated circuit is characterized based on a comparison of the first and second apparent resistance measures. For example, characterizing the integrated circuit may comprise validating the static analysis of the integrated circuit design based on the comparison of the first and second apparent resistance measures, or determining a quality measure of the integrated circuit based on the comparison of the first and second apparent resistance measures.