The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Dec. 16, 2011
J. Harlan Yates, Melbourne, FL (US);
Mark Rahmes, Melbourne, FL (US);
Robert Haden, Rockledge, FL (US);
Patricia Brown, Melbourne, FL (US);
J. Harlan Yates, Melbourne, FL (US);
Mark Rahmes, Melbourne, FL (US);
Robert Haden, Rockledge, FL (US);
Patricia Brown, Melbourne, FL (US);
Harris Corporation, Melbourne, FL (US);
Abstract
Systems () and methods () for efficient spatial feature data analysis. The methods involve simultaneously generating two or more chip images () using image data defining a first image (); concurrently displaying an array () comprising all or a portion of the chip images in a plug-in window (); and displaying in the plug-in window information relating to an attribute (a, a) of a feature (A) contained in a selected one of the displayed chip images (). The chip images are generated in response to a user selection of a feature (A) contained in at least a portion of the first image displayed in an application window (). Each of the chip images comprises a panned view, a zoomed view, or a panned-and-zoomed view of the first image including one or more features of a user-selected feature class.