The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Jul. 25, 2012
Manoj Dusanapudi, Bangalore, IN;
Wisam Kadry, Haifa, IL;
Shakti Kapoor, Austin, TX (US);
Dimtry Krestyashyn, Haifa, IL;
Shimon Landa, Kiryat Yam, IL;
Amir Nahir, Kfar Vitkin, IL;
John Schumann, Austin, TX (US);
Gil Eliezer Shurek, Haifa, IL;
Vitali Sokhin, Haifa, IL;
Manoj Dusanapudi, Bangalore, IN;
Wisam Kadry, Haifa, IL;
Shakti Kapoor, Austin, TX (US);
Dimtry Krestyashyn, Haifa, IL;
Shimon Landa, Kiryat Yam, IL;
Amir Nahir, Kfar Vitkin, IL;
John Schumann, Austin, TX (US);
Gil Eliezer Shurek, Haifa, IL;
Vitali Sokhin, Haifa, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method includes executing a first post-silicon testing program by a reference model. During the execution of the first post-silicon testing program, one or more test-cases are generated. The first post-silicon testing program is executed in an offline generation mode. During execution of the first post-silicon testing program each test case is generated in a different memory location. After the execution, generating a second post-silicon testing program that is configured to execute the one or more test-cases. The method further includes executing the second post-silicon testing program on an acceleration platform.