The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

Aug. 10, 2012
Applicants:

Scott P. Nixon, Fort Collins, CO (US);

Eric M. Rentschler, Windsor, CO (US);

Inventors:

Scott P. Nixon, Fort Collins, CO (US);

Eric M. Rentschler, Windsor, CO (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An integrated circuit with multiple clock domain tracing capability includes a debug module including a global time stamp counter for counting pulses of a reference clock signal to provide a global time stamp, a first granularity counter for counting pulses of a first clock signal to provide a first granularity count, a second granularity counter for counting pulses of a second clock signal to provide a second granularity count and a trace cache buffer for selectively storing in a first partition the global time stamp, the first granularity count, and first data synchronous to the first clock signal, and for selectively storing in a second partition the global time stamp, the second granularity count, and second data synchronous to the second clock signal.


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