The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Aug. 07, 2012
Oleg Kupershmidt, Bedford, MA (US);
Jason Joseph Spofford, Austin, TX (US);
Oleg Kupershmidt, Bedford, MA (US);
Jason Joseph Spofford, Austin, TX (US);
CA, Inc., Islandia, NY (US);
Abstract
A method includes collecting, as data points, variable data associated with a monitored parameter. The method includes determining whether one or more of a first criterion and a second criterion is satisfied. The first and second criteria are satisfied based on a first quantity of the data points and a second quantity of data points in a selective subset of the data points, respectively. The method includes estimating an approximate baseline value for the monitored parameter in a first manner by utilizing each data point of a portion of the data points in response to determining that the first criterion is satisfied and the second criterion is not satisfied, and in a second manner by determining a second baseline value utilizing each data point of a portion of the selective subset of the data points in response to determining that the first criterion and the second criterion are both satisfied.