The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Oct. 21, 2009
Xin Zhou, Monterey Park, CA (US);
Olli Pekka Kostamaa, Santa Monica, CA (US);
Xin Zhou, Monterey Park, CA (US);
Olli Pekka Kostamaa, Santa Monica, CA (US);
Teradata US, Inc., Dayton, OH (US);
Abstract
A system, method, and computer-readable medium that facilitate dynamic skew avoidance are provided. The disclosed mechanisms advantageously do not require any statistic information regarding which values are skewed in a column on which a query is applied. Query selectivity is evaluated at a check point and thereby facilitates accurate detection of an overloaded processing module. The successful detection of an overloaded processing module causes other processing modules to stop sending more skewed rows to the overloaded processing module. Detection of an overloaded processing module is made when the overloaded processing module has received more rows than a target number of rows. Further, skewed rows that are maintained locally rather than redistributed to a detected processing module may result in more processing modules becoming overloaded. Advantageously, the disclosed mechanisms provide for a final redistribution adjustment to provide for even distribution of rows among all processing modules.