The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

Apr. 27, 2011
Applicants:

Tadaaki Sakakibara, Kariya, JP;

Hirokazu Watanabe, Obu, JP;

Yoshio Nakagaki, Toyota, JP;

Kenji Fukuta, Chita-gun, JP;

Inventors:

Tadaaki Sakakibara, Kariya, JP;

Hirokazu Watanabe, Obu, JP;

Yoshio Nakagaki, Toyota, JP;

Kenji Fukuta, Chita-gun, JP;

Assignee:

Denso Corporation, Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01); G07C 5/08 (2006.01); B60R 16/023 (2006.01);
U.S. Cl.
CPC ...
B60R 16/0232 (2013.01); G05B 23/0262 (2013.01); G07C 5/0816 (2013.01); G07C 5/085 (2013.01); G05B 23/0235 (2013.01);
Abstract

The failure sign detection apparatus includes an abnormality detector to make a comparison between a failure detection parameter of a vehicle device mounted on a vehicle and a predetermined abnormality detection threshold, and make a determination whether there is an abnormality in the vehicle device based on a result of the comparison, a failure sign evaluation index calculator to calculate a failure sign evaluation index for evaluating a sign of failure of the vehicle device based on an abnormality duration period over which the detected abnormality continues and a parameter threshold difference indicative of a difference between the abnormality detection threshold and the failure detection parameter, and a failure sign detector to detect a sign of failure of the vehicle device based on the failure sign evaluation index calculated by the failure sign evaluation index.


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