The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Sep. 22, 2011
Applicants:
Fan LI, Beijing, CN;
Chunshui Zhao, Beijing, CN;
Feng Zhao, Bellevue, WA (US);
Inventors:
Assignee:
Microsoft Corporation, Redmond, WA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01C 22/00 (2006.01); G01R 23/00 (2006.01); G01C 21/16 (2006.01); G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
G01C 22/006 (2013.01); G01C 21/165 (2013.01); G06F 19/00 (2013.01);
Abstract
Step detection and step length estimation techniques include detecting salient points in sensor data of one or more sensors. A step frequency is estimated based on a time interval between the detected salient points. A step length of the step may then be computed based on a nonlinear combination of the estimated step frequency and a function of the sensor data, and/or a step model. Alternatively, the step length of the step may be computed based on a combination of a nonlinear function of the estimated step frequency and a (linear or nonlinear) function of the sensor data, and/or a step model.