The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Mar. 30, 2011
Toshihiro Kamitani, Nishinomiya, JP;
Toshihiro Mori, Takatsuki, JP;
Toshihiro Kamitani, Nishinomiya, JP;
Toshihiro Mori, Takatsuki, JP;
Hokuyo Automatic Co., Ltd., Osaka, JP;
Abstract
A signal processing apparatus includes a differential processing unit to differentiate a reflection signal corresponding to a pulse measurement beam that is periodically scanned in a polarized manner; an arithmetic unit to obtain, with a rising time of a first-order-differential reflection signal as a reference, a barycentric position of the first order differential reflection signal as a detection time of a reflected beam, and to calculate a distance to a measured object based on a time difference between an output time of the measurement beam and the detection time of the reflected beam; and a waveform determining unit to determine whether the reflected beam includes a plurality of overlapping reflected beams from a plurality of measured objects, based on rising and falling characteristics of the first-order-differential reflection signal and based on a rising characteristic of a second-order-differential reflection signal obtained by the second order differential of the reflection signal.
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