The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Jun. 15, 2011
Applicants:
Kelly Jean Lechtenberg, Albuquerque, NM (US);
Qingqiu Ginger Shao, Oro Valley, AZ (US);
Inventors:
Kelly Jean Lechtenberg, Albuquerque, NM (US);
Qingqiu Ginger Shao, Oro Valley, AZ (US);
Assignee:
Honeywell International Inc., Morristown, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Methods, systems and apparatus are provided for ranking tests of interest. A set of failure modes of interest and a set of tests of interest are determined. A differentiation factor is then computed for each of the tests of interest, and each of the tests of interest can then be ranked based on their respective differentiation factors.
Lechtenberg, Kelly. (2014). Methods systems and apparatus for ranking tests used to identify faults in a system (U.S. Patent No. 8831901). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8831901
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile