The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Jun. 27, 2011
Radek Hedl, okres Blansko, CZ;
Jindrich Finda, Brno, CZ;
Karel Adamek, Brno, CZ;
Honeywell International Inc., Morristown, NJ (US);
Abstract
A system and method for detecting and evaluating structural defects are provided. Baseline data representative of sensed ultrasonic waves that were transmitting into a structure with no defects are stored. Ultrasonic waves are transmitted into the structure from a plurality of actuators that are coupled to the structure. The ultrasonic waves that are transmitted into the structure from the plurality of actuators are sensed, with a plurality of sensors that are coupled to the structure and spaced apart from the actuators, to thereby generate and supply sensor data. Signal difference coefficients are calculated from the baseline data and the sensor data. The calculated signal difference coefficients are spatially mapped to detect one or more structural defects in the structure.