The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

Oct. 25, 2011
Applicants:

Mark D Ray, Burnsville, MN (US);

Kaare J Anderson, Farmington, MN (US);

Michael P Nesnidal, Shakopee, MN (US);

Inventors:

Mark D Ray, Burnsville, MN (US);

Kaare J Anderson, Farmington, MN (US);

Michael P Nesnidal, Shakopee, MN (US);

Assignee:

Rosemount Aerospace Inc., Burnsville, MN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G01N 21/00 (2006.01); G01N 15/02 (2006.01); G01S 17/95 (2006.01); G01N 15/00 (2006.01); B64D 15/20 (2006.01);
U.S. Cl.
CPC ...
G01S 17/95 (2013.01); G01N 15/0211 (2013.01); G01N 2015/0026 (2013.01); B64D 15/20 (2013.01);
Abstract

In one aspect, methods of determining a size distribution of water droplets in a cloud are described herein. In some embodiments, a method of determining a size distribution of water droplets in a cloud comprises sampling a depth of the cloud with a beam of electromagnetic radiation, measuring a scattering signal of the electromagnetic radiation returned from the cloud over a range of field of view angles to provide a measured scattering curve [p(θ)], removing a portion of the measured scattering curve, replacing the removed portion with an extrapolation of the remaining measured scattering curve to provide an estimated scattering curve, and determining a first estimate droplet size distribution [n(D)] from the estimated scattering curve.


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