The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Dec. 10, 2008
Soon-geun Jang, Changwon, KR;
Eun-sun Ahn, Changwon, KR;
Jin-pyo Gwak, Changwon, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method of obtaining variance data or standard deviation data for efficiently reducing noise in an image is provided. The method includes (a) dividing an image into a plurality of clusters; (b) checking frequency data of data values of pixels included in each cluster; (c) obtaining a weighted average of the data values of the pixels included in each cluster; (d) obtaining a variance or a standard deviation of the data values of the pixels included in each cluster by using the weighted average; and (e) obtaining variance data or standard deviation data in accordance with weighted averages by using the weighted average and the variance or the standard deviation in each cluster. A digital photographing apparatus is also provided that includes a recording medium storing variance data or standard deviation data for efficiently reducing noise in an image which is obtained in accordance with the above method.