The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Jun. 09, 2009
Dan Gudmundson, Quebec, CA;
Eric Bourbeau, Quebec, CA;
Luc Perron, Charlesbourg, CA;
Optosecurity Inc., Quebec, Quebec, CA;
Abstract
A method, an apparatus and a system are provided for deriving a characteristic of a product using X-rays. X-ray image data associated with the product is received, the X-ray image data being derived by performing an X-ray scan of the product using an X-ray imaging apparatus and conveying attenuation information resulting from interaction of X-rays with the product. A response of a reference product to X-rays is then simulated to generate simulated X-ray image data. The simulated X-ray image data and the received X-ray image data are then processed to derive one or more characteristics of the product. Information conveying the derived characteristic of the product is then released. In a specific implementation, the product is a liquid product comprised of a bottle at least partially filled with liquid and the derived characteristic of the liquid product is a threat status assessment associated with the liquid in the bottle. In another aspect, a simulation engine for simulating interactions between X-rays and objects is also provided.