The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Jan. 19, 2010
Masahiro Fujikawa, Fukuchiyama, JP;
Daisuke Mitani, Ayabe, JP;
Masahiro Takayama, Kitakyushu, JP;
Katsuhiro Shimoda, Otsu, JP;
Yoshihiro Moritoki, Takatsuki, JP;
Masahiro Fujikawa, Fukuchiyama, JP;
Daisuke Mitani, Ayabe, JP;
Masahiro Takayama, Kitakyushu, JP;
Katsuhiro Shimoda, Otsu, JP;
Yoshihiro Moritoki, Takatsuki, JP;
Omron Corporation, Kyoto, JP;
Abstract
This invention provides a parameter determination assisting device and a parameter determination assisting program enabling a more rapid and easy determination of a parameter to be set in a processing device, which obtains a processing result by performing a process using a set of parameters defined in advance on image data obtained by imaging a measuring target object. A user can easily select an optimum parameter set when a determination result and a statistical output are displayed in a list for each of a plurality of trial parameter candidates. For instance, while trial numbers '2', '4', and “5”, in which the number of false detections is zero, can perform a stable process, the parameter set of the trial number “2” is comprehensively assumed as optimum since the trial number “2” can perform the process in the shortest processing time length.