The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

Dec. 29, 2009
Applicant:

Yoshinori Ohno, Kyoto, JP;

Inventor:

Yoshinori Ohno, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/34 (2006.01); G06K 9/40 (2006.01); A61B 6/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0083 (2013.01); A61B 6/4233 (2013.01); G06T 2207/30004 (2013.01); A61B 6/5258 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20056 (2013.01); G06T 7/0095 (2013.01); G06T 2207/20064 (2013.01); G06T 2207/20061 (2013.01);
Abstract

A radiographic image processing apparatus in this invention decreases a spatial resolution twice in total by a low-frequency image generating device and a low-frequency characteristic generating device. Thereby an influence such as noise and thus calculation amounts are decreased. Moreover, excessive characteristic amounts (patterns) not removed among characteristic amounts extracted through the low-frequency image generating device and a characteristic extracting device can be decreased by decrease of the spatial resolution by the low-frequency characteristic generating device. Consequently, influence such as noise and calculation amounts can be decreased for the low-frequency characteristics generated by the low-frequency characteristic generating device and a radiation area extracted by an area extracting device on the latter stage. As a result, influences such as noise can be decreased for achieving characteristic extraction and area extraction with high accuracy, and thus calculation amounts can be decreased.


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