The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Jan. 31, 2011
Applicants:
Naoki Kohara, Utsunomiya, JP;
Hidenosuke Itoh, Tokyo, JP;
Inventors:
Naoki Kohara, Utsunomiya, JP;
Hidenosuke Itoh, Tokyo, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01); A61B 6/00 (2006.01); A61B 6/06 (2006.01); G01N 23/20 (2006.01);
U.S. Cl.
CPC ...
A61B 6/06 (2013.01); A61B 6/484 (2013.01); A61B 6/4092 (2013.01); A61B 6/4291 (2013.01); G01N 23/20008 (2013.01);
Abstract
There is provided an X-ray imaging method for reducing unnecessary components caused by a transmittance distribution of an object and unevenness in irradiation by a light source and accurately calculating a differential phase at the time of X-ray imaging by SDG.