The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

May. 30, 2013
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Maya Barkon, Haifa, IL;

Meir Dalal, Rishon Lezion, IL;

Moti Teitel, Shoham, IL;

Micha Anholt, Tel Aviv, IL;

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01); G11C 16/34 (2006.01); G11C 27/00 (2006.01); G11C 29/02 (2006.01); G11C 11/56 (2006.01);
U.S. Cl.
CPC ...
G11C 27/00 (2013.01); G11C 16/3418 (2013.01); G11C 29/021 (2013.01); G11C 29/028 (2013.01); G11C 11/5642 (2013.01);
Abstract

A method includes reading a group of analog memory cells using first explicit read thresholds, to produce first readout results. The group is re-read using second explicit read thresholds, to produce second readout results. The group is read using one or more sets of auxiliary thresholds so as to produce auxiliary readout results, such that the number of the auxiliary thresholds in each set is the same as the number of the first explicit read thresholds and the same as the number of the second explicit read thresholds. A readout performance of third read thresholds, which include at least one of the first explicit read thresholds and at least one of the second explicit read thresholds, is evaluated using the first, second and auxiliary readout results.


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