The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Oct. 01, 2010
Ayumi Sano, Kawasaki, JP;
Fumihiro Goto, Kawasaki, JP;
Akitoshi Yamada, Yokohama, JP;
Akihiko Nakatani, Kawasaki, JP;
Mitsuhiro Ono, Tokyo, JP;
Fumitaka Goto, Tokyo, JP;
Okinori Tsuchiya, Yokohama, JP;
Takashi Fujita, Kawasaki, JP;
Rie Kajihara, Minoo, JP;
Tomokazu Ishikawa, Kawasaki, JP;
Ayumi Sano, Kawasaki, JP;
Fumihiro Goto, Kawasaki, JP;
Akitoshi Yamada, Yokohama, JP;
Akihiko Nakatani, Kawasaki, JP;
Mitsuhiro Ono, Tokyo, JP;
Fumitaka Goto, Tokyo, JP;
Okinori Tsuchiya, Yokohama, JP;
Takashi Fujita, Kawasaki, JP;
Rie Kajihara, Minoo, JP;
Tomokazu Ishikawa, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Provided is an image processor and image processing method that are capable of suppressing both density unevenness and graininess that occur due to deviation of the printing position of dots that are printed by a plurality of relative movements (or a plurality of printing element groups). In order to accomplish this, the dot overlap rate of an image characteristic in which density unevenness stands out is made higher than the dot overlap rate of an image characteristic in which other defects stand out more than the density unevenness. By doing so, it is possible to suitably adjust the dot overlap rate according to an image characteristic, and to output an image having no density unevenness or graininess.