The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

Jun. 16, 2011
Applicants:

Ryu Narusawa, Kanagawa, JP;

Yu Hirono, Tokyo, JP;

Junichi Sakagami, Tokyo, JP;

Inventors:

Ryu Narusawa, Kanagawa, JP;

Yu Hirono, Tokyo, JP;

Junichi Sakagami, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/47 (2006.01); H04N 7/18 (2006.01); G02B 21/24 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/241 (2013.01); G02B 21/367 (2013.01);
Abstract

Provided is an information processing apparatus including: a connection connecting to a microscope including a stage having a disposition surface on which a target object can be placed, and an image picking-up section including an objective lens for picking up an image of the object, the microscope being movable in first and second axis directions orthogonal to an optical axis of the objective lens and orthogonal to each other and in a third axis direction along the optical axis; a calculator calculating, as an undulation-correcting value, a value for correcting a misalignment of a position in the third axis direction for each predetermined image-capturing range smaller than the disposition surface; a correcting-value storage storing the calculated value; and a corrector correcting a relative distance between the stage and the objective lens on the basis of the stored value for each image-capturing range.


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