The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

Jan. 04, 2009
Applicants:

Janos Rohaly, Acton, MA (US);

Ilya A. Kriveshko, Littleton, MA (US);

Inventors:

Janos Rohaly, Acton, MA (US);

Ilya A. Kriveshko, Littleton, MA (US);

Assignee:

3M Innovative Properties Company, Saint Paul, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); A61C 13/00 (2006.01); G06K 9/00 (2006.01); G06T 17/00 (2006.01);
U.S. Cl.
CPC ...
G06T 17/00 (2013.01); A61C 13/0004 (2013.01); G06K 9/00214 (2013.01); H04N 13/0221 (2013.01); G06T 2207/10012 (2013.01); G06T 2210/41 (2013.01); G06K 9/00201 (2013.01);
Abstract

A hierarchical pattern matching process is improved for use in three-dimensional reconstruction by calculating a disparity field for low-resolution data, and using this low-resolution disparity field to estimate the disparity field for higher-resolution images. By pre-warping a template according to the estimated disparity field, improved correlation results can be obtained.


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