The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Sep. 30, 2011
Alan D. Amis, Plano, TX (US);
George A. Deprez, Parker, TX (US);
Terry J. Hammer, Cedar Rapids, IA (US);
Michael D. Dzado, Marion, IA (US);
Alan D. Amis, Plano, TX (US);
George A. Deprez, Parker, TX (US);
Terry J. Hammer, Cedar Rapids, IA (US);
Michael D. Dzado, Marion, IA (US);
Rockwell Collins, Inc., Cedar Rapids, IA (US);
Abstract
The present invention is a universal stack analyzer which is configured for collecting data at (ex.—from) all layers of a stack and filtering the collected data to isolate selected data included in the collected data. The selected data is selected via user inputs provided to a user interface of the universal stack analyzer and filtering of the collected data to isolate the selected data from the collected data is performed based upon filters generated in response to the received user inputs. The selected data is then displayed via a graphical viewer of the stack analyzer in a user-friendly graphical format. The universal stack analyzer is waveform-agnostic.