The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

Jul. 06, 2012
Applicants:

Toshiyuki Nakaie, Wakayama, JP;

Joji Kayano, Wakayama, JP;

Inventors:

Toshiyuki Nakaie, Wakayama, JP;

Joji Kayano, Wakayama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/64 (2006.01); G01R 22/08 (2006.01); G01R 19/00 (2006.01);
U.S. Cl.
CPC ...
G01R 22/08 (2013.01); G01R 19/0023 (2013.01);
Abstract

An integral value measuring circuit includes an operational amplifier and a capacitor connected between input and output sides thereof, an electric potential of an output terminal where a predetermined resistance element connected to an output side of the operational amplifier is being zero, positive and negative DC voltage generating circuits which comprise positive and negative power sources, respectively, at the output side of the operational amplifier, the positive and negative DC voltage generating circuits and being connected to positive and negative power terminals, respectively, of the operational amplifier through switches, and a connection line between the negative power terminal and one switch and a connection line between the positive power terminal and another switch being connected to the positive and negative power terminals, respectively, of the operational amplifier through cross resistance elements having resistance values negligible compared to a leakage resistance value of the switches.


Find Patent Forward Citations

Nakaie, Toshiyuki. (2014). Integral value measuring circuit (U.S. Patent No. 8829972). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8829972

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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