The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Jan. 27, 2010
Applicants:
Frank Cyriel Michel Defoort, Kruibeke-Bazel, BE;
Danny Van Bruyssel, Bonheiden, BE;
Inventors:
Frank Cyriel Michel Defoort, Kruibeke-Bazel, BE;
Danny Van Bruyssel, Bonheiden, BE;
Assignee:
Alcatel Lucent, Boulogne Billancourt, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); H04M 3/08 (2006.01); H04M 3/30 (2006.01);
U.S. Cl.
CPC ...
H04M 3/085 (2013.01); H04M 3/30 (2013.01);
Abstract
In one embodiment, the method for locating a defect in a wired transmission line, which extends between a first end and a second end, includes measuring a first modified noise signal at the first end by a first measuring unit, and making a first representation of the first modified noise signal. A second modified noise signal is measured at the second end by a second measuring unit, and a second representation of the second modified noise signal is made. The location of the defects are derived from the representations.