The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

Dec. 09, 2011
Applicants:

Bijay Kamleshbhai Shah, Brookfield, WI (US);

Eddy Benjamin Boskamp, Pewaukee, WI (US);

Ricardo Becerra, Waukesha, WI (US);

Inventors:

Bijay Kamleshbhai Shah, Brookfield, WI (US);

Eddy Benjamin Boskamp, Pewaukee, WI (US);

Ricardo Becerra, Waukesha, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An MRI apparatus includes a magnetic resonance imaging (MRI) system having a plurality of gradient coils positioned about a bore of a magnet, an RF coil assembly having at least a first port and a second port, an RF transceiver system having a pulse module and configured to transmit RF signals to the first port and the second port, and a computer programmed to drive the RF coil assembly in quadrature through the at least first port and the second port, measure a Bfield using at least one flux probe at two or more angular orientations within the RF coil assembly, and characterize and optimize performance of the MRI system based on the measurements of the Bfield.


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