The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2014
Filed:
Jun. 21, 2011
Ralf Krueger, Butzbach Griedel, DE;
Ralf Krueger, Butzbach Griedel, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
The present invention relates to an autofocus aperture stop () in a triangulating autofocusing device () for a microscope (), wherein the autofocus aperture stop () comprises at least one diaphragm opening () with which a measuring beam pencil () used for the autofocusing and running in the direction of the optical axis () of the autofocusing device () can be limited in its cross section, wherein the diaphragm opening () of the autofocus aperture stop () is arranged in a decentred position at a spacing from the optical axis () of the autofocusing device (), wherein a decentred autofocus measuring beam () can be generated by the diaphragm opening () in one half of the cross section () of the measuring beam pencil ().