The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

Apr. 19, 2011
Applicants:

Junko Nakajima, Tokyo, JP;

Norihiko Utsunomiya, Machida, JP;

Inventors:

Junko Nakajima, Tokyo, JP;

Norihiko Utsunomiya, Machida, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01);
Abstract

To accurately detect a movement of an object based on an image distorted by the movement of an eye to be inspected, which is acquired by a scanning imaging system, provided is an ophthalmologic apparatus including: an extraction means for extracting a plurality of characteristic images from a first fundus image of the eye to be inspected; a fundus image acquisition means for acquiring a second fundus image of the eye to be inspected during a period different from a period during which the first fundus image is acquired; and a calculation means for calculating at least a rotational movement of the eye to be inspected based on the plurality of characteristic images and the second fundus image.


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