The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8826239 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 02, 2014

Filed:

Oct. 06, 2010
Applicant:

Yoshiaki Sawano, Zama, JP;

Inventor:

Yoshiaki Sawano, Zama, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3684 (2013.01);
Abstract

A system and associated method for asynchronous code testing in an Integrated Development Environment (IDE). The IDE has components of a source code editor, an impact analyzer, a test case launcher, a graphical user interface (GUI), and a database. All components run concurrently for asynchronous and real-time code editing. Upon modification of a code block of an input code, a test case is automatically generated and a launching priority is calculated based on the relationship between the modified code block and each code block affected by the modification. Generated test cases are automatically run by the test case launcher or manually selected by the user to produce a test run result.


Find Patent Forward Citations

Sawano, Yoshiaki. (2014). Asynchronous code testing in integrated development environment (ide) (U.S. Patent No. 8826239). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8826239

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