The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2014
Filed:
Nov. 09, 2010
Filip Radlinski, Vancouver, CA;
Paul Nathan Bennett, Kirkland, WA (US);
Emine Yilmaz, Cambridge, GB;
Filip Radlinski, Vancouver, CA;
Paul Nathan Bennett, Kirkland, WA (US);
Emine Yilmaz, Cambridge, GB;
Microsoft Corporation, Redmond, WA (US);
Abstract
Measuring duplication in search results is described. In one example, duplication between a pair of results provided by an information retrieval system in response to a query is measured. History data for the information retrieval system is accessed and query data retrieved, which describes the number of times that users have previously selected either or both of the pair of results, and a relative presentation sequence of the pair of results when displayed at each selection. From the query data, a fraction of user selections is determined in which a predefined combination of one or both of the pair of results were selected for a predefined presentation sequence. From the fraction, a measure of duplication between the pair of results is found. In further examples, the information retrieval system uses the measure of duplication to determine an overall redundancy value for a result set, and controls the result display accordingly.