The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 02, 2014
Filed:
Sep. 15, 2010
Shrihari Vasudevan, Chippendale, AU;
Fabio Tozeto Ramos, Erskineville, AU;
Eric Nettleton, Research, AU;
Hugh Durrant-whyte, Rozelle, AU;
Shrihari Vasudevan, Chippendale, AU;
Fabio Tozeto Ramos, Erskineville, AU;
Eric Nettleton, Research, AU;
Hugh Durrant-Whyte, Rozelle, AU;
The University of Sydney, Sydney, AU;
Abstract
A method of computerized data analysis and synthesis is described. First and second datasets of a quantity of interest are stored. A Gaussian process model is generated using the first and second datasets to compute optimized kernel and noise hyperparameters. The Gaussian process model is applied using the stored first and second datasets and hyperparameters to perform Gaussian process regression to compute estimates of unknown values of the quantity of interest. The resulting computed estimates of the quantity of interest result from a non-parametric Gaussian process fusion of the first and second measurement datasets. The first and second datasets may be derived from the same or different measurement sensors. Different sensors may have different noise and/or other characteristics.